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Download Atom Probe Tomography: Analysis at the Atomic Level by M. K. Miller (auth.) PDF

By M. K. Miller (auth.)

The microanalytical means of atom probe tomography (APT) allows the spatial coordinates and elemental identities of the person atoms inside of a small quantity to be decided with close to atomic solution. as a result, atom probe tomography presents a strategy for buying atomic answer 3­ dimensional photos of the solute distribution in the microstructures of fabrics. This monograph is designed to supply researchers and scholars the mandatory info to plot and experimentally behavior an atom probe tomography test. The options required to imagine and to research the ensuing 3-dimensional facts also are defined. The monograph is geared up into chapters each one protecting a particular element of the strategy. the improvement of this robust microanalytical procedure from the origins offield ion microscopy in 1951, in the course of the first 3-dimensional atom probe prototype inbuilt 1986 to ultra-modern advertisement state of the art 3­ dimensional atom probe is documented in bankruptcy 1. A normal creation to atom probe tomography is usually offered in bankruptcy 1. many of the easy methods to fabricate appropriate needle-shaped specimens are offered in bankruptcy 2. The technique to shape box ion photos of the needle-shaped specimen is defined in bankruptcy three. moreover, the looks of microstructural beneficial properties and the knowledge which may be anticipated from box ion microscopy are summarized. a quick account of the theoretical foundation for tactics of box ionization and box evaporation can also be included.

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Extra resources for Atom Probe Tomography: Analysis at the Atomic Level

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K. B. Alexander, P. Angelini and M. K. Miller, J. , 50-C8 (1989) 549. 25. A. R. Waugh. S. Payne, G. M. Worrall and G. D. W. Smith, J. , 45-C9 (1984) 207. 26. J. A. Liddle, A. Norman, A. Cerezo and C. R. M. Grovenor, J. , 49-C6 (1988) 509. 27. D. J. Larson, C. Teng, P. P. Camus and T. F. Kelly, Appl. Surf. Sci. 87/88 (1995) 446. 28. A. J. Melmed, J. , 49-C6 (1988) 67. 29. M. G. Burke and S. S. Brenner, J. , 47-C2 (1986) 239. Chapter 3 Field Ion Microscopy Field ion microscopy is an important step that is almost always used at the start of an atom probe experiment to produce an atomically clean specimen with a well developed end form.

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5% H 2S04 in water Gallium Phosphide 25% RN03 in HCI Nb 3Sn 10% HF in RN0 3 Silicon 30-50% HF in RN0 3 The Art of Specimen Preparation 35 Fig. 6. Chemical etching method in which the rate of removal of material from the sides of the specimen is balanced against the rate of removal from the end of the specimen. 3 Micropolishing Another method that is commonly used to sharpen blunt or damaged specimens is micropolishing [16]. In this method, the specimen is positioned so that the end of the needle is located in the center of a drop of electrolyte suspended in a wire loop, as shown in Fig.

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